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21 September 1994 Silicon detector probe for gamma-ray and x-ray backscatter radiation
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Abstract
The paper presents an application of photodiodes of typical series production, specially selected for detector array in a X, gamma probe for checking the nonuniformity of structures. The probe is used in connection to a measuring unit, as a portable instrument.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eugenia T. Halmagean, Cristian C. Lazarovici, Doina N. Lazarovici, Valerica Cimpoca, and Marian N. Udrea-Spinea "Silicon detector probe for gamma-ray and x-ray backscatter radiation", Proc. SPIE 2305, Gamma-Ray Detector Physics and Applications, (21 September 1994); https://doi.org/10.1117/12.187261
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