5 August 1994 Stability analysis of Voigt profiles
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Proceedings Volume 2321, Second International Conference on Optoelectronic Science and Engineering '94; (1994) https://doi.org/10.1117/12.182155
Event: Optoelectronic Science and Engineering '94: International Conference, 1994, Beijing, China
Abstract
The logistic map implicit in the Voigt profiles is revealed and the stability criterion of the Voigt profiles is found as (eta) < 1.04. The explanation of depressing the effect of spatial hole burning in gas lasers is given and other potential uses of the stability analysis of the Voigt profiles are mentioned.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shenchu Xu, Shenchu Xu, Shi Lin, Shi Lin, Fenxian Chen, Fenxian Chen, Zhongguang Wu, Zhongguang Wu, } "Stability analysis of Voigt profiles", Proc. SPIE 2321, Second International Conference on Optoelectronic Science and Engineering '94, (5 August 1994); doi: 10.1117/12.182155; https://doi.org/10.1117/12.182155
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