5 August 1994 Study of a new type of interference selective amplitude modulation spectrometer
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Proceedings Volume 2321, Second International Conference on Optoelectronic Science and Engineering '94; (1994) https://doi.org/10.1117/12.182159
Event: Optoelectronic Science and Engineering '94: International Conference, 1994, Beijing, China
Abstract
A new type of interference selective amplitude modulation spectrometer is described. The diffraction grating which is illuminated by collimated incident beam coming from a point aperture is placed in front of the incident arm of a Twyman interferometer. The flux is divided by the beam splitter into two beams and falling on two mirrors which are equivalent to two diffraction gratings. Then the interference fringe is modulated. The spectrometer has the ability to achieve high resolution and high transmission. Its mechanical stability is improved and can be used in the research of visible and ultraviolet region. Theoretical analysis of the flux and resolution is made. Using rectangle diaphragm the resolution is 1.35 times of the grating. At the last of the article the apodization technique with elliptical diaphragm is discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xingyu Yang, Qiyuan Feng, Runlin Li, "Study of a new type of interference selective amplitude modulation spectrometer", Proc. SPIE 2321, Second International Conference on Optoelectronic Science and Engineering '94, (5 August 1994); doi: 10.1117/12.182159; https://doi.org/10.1117/12.182159
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