14 September 1994 Progressive censoring: an efficient method to reduce time consumption of accelerated lifetime tests
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Abstract
Progressively censored data obtained from accelerated life time tests on contact chains of individual contact interconnect (CI) systems connected by probe pads were compared to simulated complete data sets. Depending on stress conditions, the time required to gain 1% of precision (95% confidence) of low percentiles, tprec, can be as low as 2% of that required for complete data. As progressive censoring allows for the start of experiments with a high number of objects, simultaneous failures of CI systems are observable. It turned out that ignoring these `multiple failures' (`MFs') can lead to a considerable overestimation of reliability, if `MFs' are accumulated at early failures. A new test structure allowing for automated testing of individual CI systems in series is proposed. Several methods of evaluation of data obtainable from the test structure are discussed in detail using maximum likelihood estimation of simulated data. A `1 out of X' assumption of detected failed subparts of the test structure turned out to be sufficient in most cases of possible accumulations of `MFs.' Life time is overestimated if early `MFs' are ignored. The problem of assessing normality of complete, and progressively censored data is discussed.
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Hans-Dieter Hartmann, "Progressive censoring: an efficient method to reduce time consumption of accelerated lifetime tests", Proc. SPIE 2334, Microelectronics Manufacturability, Yield, and Reliability, (14 September 1994); doi: 10.1117/12.186753; https://doi.org/10.1117/12.186753
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KEYWORDS
Accelerated life testing

Reliability

Data modeling

Metals

Data analysis

Error analysis

Chlorine

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