Intellectual information system of precedent search and expert diagnostics of technological malfunctions in very large scale integration (VLSI) manufacturing

Peter A. Arutyunov; Mikhail G. Kuznetsov; Elena G. Yermakova

doi:10.1117/12.186793

16 September 1994 Intellectual information system of precedent search and expert diagnostics of technological malfunctions in very large scale integration (VLSI) manufacturing

Peter A. Arutyunov, Mikhail G. Kuznetsov, Elena G. Yermakova

Author Affiliations +

Proceedings Volume 2336, Manufacturing Process Control for Microelectronic Devices and Circuits; (1994) https://doi.org/10.1117/12.186793
Event: Microelectronic Manufacturing, 1994, Austin, TX, United States

Abstract

The field of Information Intellectual System (IIS) application in technology spreads over solving problems, that cannot be easily formalized and that are connected with the diagnostics and quality control of VLSI. One of the main tasks of IIS in the technology of Microelectronics is the precedent search. Another task no less serious is to mathematically process technological experience using information coded array. The purpose of it is, firstly, to establish interrelation between symptomatic and failures and secondly, to choose an optimal plan of rehabilitation of the technological process and the crystal. The paper describes the basic concepts and principles of software and mathematical software development of computer system of expert diagnostics of technological malfunctions in VLSI manufacturing. The system includes: data base (DB), knowledge base (KB) and subsystems (of precedent search, expert diagnostics and consultations on rehabilitation). DB and KB contain information of defects, their characteristics and failure mechanisms for MOS and bipolar VLSI, taken from scientific publications. The research prototype of this system was realized on IBM Pc using Multiwindow Interface CLIPPER.

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Peter A. Arutyunov, Mikhail G. Kuznetsov, and Elena G. Yermakova "Intellectual information system of precedent search and expert diagnostics of technological malfunctions in very large scale integration (VLSI) manufacturing", Proc. SPIE 2336, Manufacturing Process Control for Microelectronic Devices and Circuits, (16 September 1994); https://doi.org/10.1117/12.186793

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KEYWORDS

Very large scale integration

Diagnostics

Crystals

Manufacturing

Logic

Ions

Computing systems

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