12 October 1994 Comparison of techniques for substrate birefringence measurement
Author Affiliations +
Proceedings Volume 2338, 1994 Topical Meeting on Optical Data Storage; (1994) https://doi.org/10.1117/12.190209
Event: Optical Data Storage '94, 1994, Dana Point, CA, United States
State of the art techniques for measuring magneto optic disks birefringence are reviewed. As an illustration of one technique, we measured the birefringence of different magneto optic disk substrates by ellipsometry. The retardation data was fitted to an analytical expression as a function of the different indices of refraction. The variation of birefringence with the depth of the substrate is suspected to affect optimum focus and track error signal. A novel scanning micropolarimeter technique for measuring the index of refraction tensor though the depth of the magneto optic substrates is presented. Modeling to study the effects of typical birefringence profiles on the performance characteristic os magneto optic disks using the data from a scanning micropolarimeter is discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Raymond-Noel Kono, Raymond-Noel Kono, Myung S. Jhon, Myung S. Jhon, Thomas E. Karis, Thomas E. Karis, "Comparison of techniques for substrate birefringence measurement", Proc. SPIE 2338, 1994 Topical Meeting on Optical Data Storage, (12 October 1994); doi: 10.1117/12.190209; https://doi.org/10.1117/12.190209


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