12 October 1994 High-density mark edge recording on a phase-change rewritable disk by a 680-nm laser diode
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Proceedings Volume 2338, 1994 Topical Meeting on Optical Data Storage; (1994); doi: 10.1117/12.190173
Event: Optical Data Storage '94, 1994, Dana Point, CA, United States
Abstract
This paper reports a study of mark edge recording on the phase change rewritable disk. With the optical head using 680-nm laser diode and lens NA 0.6, 55 dB or higher carrier-to-noise ratio is obtained for signals whose recording mark length is 0.53 micrometers . In mark edge recording it is important to record all marks in their proper lengths. Hence, we first study shift behavior of the beginning and ending edges with regard to all marks, and then propose a new writing compensation method to make up for shifts. In the new compensation method the laser power modulation pattern consists of the first pulse, the multi-pulse chain and the last pulse. Adjusting the first and last pulse positions so that all marks are recorded in their proper lengths makes it possible to accomplish mark edge recording of the RLL (1,7) code with the linear density 0.4 micrometers /bit, jitter (sigma) /T(omega) to 6.5%. For the linear density of 0.35 micrometers /bit as well, a clear eye-pattern is obtained.
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Takashi Ishida, Mamoru Shoji, Yoshiyuki Miyabata, Yasumasa Shibata, Eiji Ohno, Shunji Ohara, "High-density mark edge recording on a phase-change rewritable disk by a 680-nm laser diode", Proc. SPIE 2338, 1994 Topical Meeting on Optical Data Storage, (12 October 1994); doi: 10.1117/12.190173; https://doi.org/10.1117/12.190173
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KEYWORDS
Modulation

Semiconductor lasers

Crystals

Laser marking

Optical discs

Optical storage

Phase shift keying

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