PROCEEDINGS VOLUME 2340
INTERNATIONAL CONFERENCE ON INTERFEROMETRY '94 | 16-20 MAY 1994
Interferometry '94: New Techniques and Analysis in Optical Measurements
INTERNATIONAL CONFERENCE ON INTERFEROMETRY '94
16-20 May 1994
Warsaw, Poland
Challenging Problems and New Approaches
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Automatic Fringe Pattern Analysis
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Applications
Proc. SPIE 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements, pg 190 (12 December 1994); doi: 10.1117/12.195911
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Interferometric Testing I: Nonconventional Optical Elements
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Interferometric Testing II
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Optical Measurement: Laser Diode and Polychromatic Light Metrology
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Optical Measurement: General
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Holographic and Speckle Metrology
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