12 December 1994 Measurement of absolute object deformations by means of two-wavelength electronic speckle pattern interferometry (ESPI)
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Abstract
Automatic processing of interferometric fringe patterns using the phase step method only leads to relative values of the deformation vector components. Extending this method to two wavelengths absolute values can be gained as known from classical interferometry. The optical as well as electronical and software expansion of an ESPI is presented allowing the system to determine absolute deformation components by automatic evaluation of fringe patterns by means of the phase step method with two wavelengths.
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Horst Kreitlow, Hans-Joachim Miesner, J. Stockmann, "Measurement of absolute object deformations by means of two-wavelength electronic speckle pattern interferometry (ESPI)", Proc. SPIE 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements, (12 December 1994); doi: 10.1117/12.195914; https://doi.org/10.1117/12.195914
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