12 December 1994 Two-directional spatial-carrier phase-shifting method for analysis of complex interferograms
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Proceedings Volume 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements; (1994); doi: 10.1117/12.195907
Event: International Conference on Interferometry '94, 1994, Warsaw, Poland
Abstract
Various interferometric and fringe projection techniques may result in complex interferograms with the information about the phenomena tested. Recent applications require the analysis on the base of a single interferogram. Here, we address two problems: simultaneous analysis of the information about two events and analysis of interferogram with high phase gradients in both x and y directions. The analysis of an interferogram is performed by the spatial-carrier phase-shifting method used sequentially for x and y sampling directions. The error analysis of the two procedures proposed is presented.
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Maria Pirga, Malgorzata Kujawinska, "Two-directional spatial-carrier phase-shifting method for analysis of complex interferograms", Proc. SPIE 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements, (12 December 1994); doi: 10.1117/12.195907; https://doi.org/10.1117/12.195907
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KEYWORDS
Fringe analysis

Error analysis

Phase shifts

Fourier transforms

Sensors

Spatial frequencies

Experimental mechanics

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