12 December 1994 Two-directional spatial-carrier phase-shifting method for analysis of complex interferograms
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Abstract
Various interferometric and fringe projection techniques may result in complex interferograms with the information about the phenomena tested. Recent applications require the analysis on the base of a single interferogram. Here, we address two problems: simultaneous analysis of the information about two events and analysis of interferogram with high phase gradients in both x and y directions. The analysis of an interferogram is performed by the spatial-carrier phase-shifting method used sequentially for x and y sampling directions. The error analysis of the two procedures proposed is presented.
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Maria Pirga, Malgorzata Kujawinska, "Two-directional spatial-carrier phase-shifting method for analysis of complex interferograms", Proc. SPIE 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements, (12 December 1994); doi: 10.1117/12.195907; https://doi.org/10.1117/12.195907
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