30 November 1994 Algorithms of specklegram analysis
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Proceedings Volume 2342, Interferometry '94: Photomechanics; (1994) https://doi.org/10.1117/12.195497
Event: International Conference on Interferometry '94, 1994, Warsaw, Poland
Speckle photography is a very accurate method of experimental strain analysis. Because specklegramm is not a counterfeitable document of the state of the analyzed object, the method can be used to test the most important elements. The analysis of the specklegramm must, however, be free of systematic errors. In the paper the sources of errors in point by point analysis are quantitatively described and some ideas of elimination are presented. The algorithms are tested on specklegramms recorded in laser light or in white light.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jerzy Pisarek, Jerzy Pisarek, "Algorithms of specklegram analysis", Proc. SPIE 2342, Interferometry '94: Photomechanics, (30 November 1994); doi: 10.1117/12.195497; https://doi.org/10.1117/12.195497


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