30 November 1994 In-plane electronic speckle pattern shearing interferometry: a theoretical analysis supported with experimental results
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Proceedings Volume 2342, Interferometry '94: Photomechanics; (1994) https://doi.org/10.1117/12.195510
Event: International Conference on Interferometry '94, 1994, Warsaw, Poland
Abstract
An analysis of the out-of-plane shearing interferometer has been performed which shows that production of in-plane strain partial derivatives, which are not affected by out-of-plane displacement function components, is possible. The in-plane data is represented as substraction correlation fringes and can be formed using two designs of interferometer. One interferometer employs a single diverging illumination beam and is applicable to object plane stress and plane strain loading conditions, while the second design uses two illumination wavefronts and is suitable for the analysis of tri-axial strain conditions. These interferometers are tested and compared using a compact tension crack specimen and the results are correlated with Finite Element software predictions of strain distributions across modeled specimens.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jon N. Petzing, Jon N. Petzing, John Raymond Tyrer, John Raymond Tyrer, "In-plane electronic speckle pattern shearing interferometry: a theoretical analysis supported with experimental results", Proc. SPIE 2342, Interferometry '94: Photomechanics, (30 November 1994); doi: 10.1117/12.195510; https://doi.org/10.1117/12.195510
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