An overview of SKIPSM (eparated-eme1 Jmage j.rocessing using Finite state Machines), a powerful new way to implement many standard image processing operations, is presented in a companion paper.' Other applications are presented in four other companion aper235 In comparison with conventional hardware-based and software-based approaches, SKIPSM allows implementation at higher speeds and/or lower hardware cost. The key theoretical developments upon which this improved performance is based ai . the separation of 2.-D binary image processing operations into a row operation followed by a column operation, . the formulation of these row and column operations in a form compatible with pipelined operation, . the implementation of the resulting operations as simple finite-state machines, and I the automated generation of the finite-state machine configuration data. This paper presents a general method for carrying out binary template matching, which is useful for image analysis in general and automated visual inspection and quality control in particular. Some key features of SKIPSM, as applied to binary template matching, are as follows: . Binary template matching with large, arbitrary templates can be implemented. Templates up to 35x35 and even larger are readily applied in a single pipelined pass. S Multipletemplates can be applied simultaneously in a single pass. . The user specifies the template or templates. All other steps can be automated. Speed increases and/or neighborhood size increases by factors of 100 or more can be achieved using conventional pipelined hardware in this new way. Alternatively, inexpensive off-the-shelf "chips" can be configured to carry out the same operations as more expensive conventional image processing hardware. Corresponding "speedups" are achieved in software-based implementations. This paper includes some simple examples of the results and gives implementation feasibility guidelines.
KEYWORDS: image processing, binary template matching, real-time, implementations, finite-state machines, inspection