3 October 1994 On-line high-resolution inspection of multilayered plastic bags
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Proceedings Volume 2347, Machine Vision Applications, Architectures, and Systems Integration III; (1994) https://doi.org/10.1117/12.188758
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Abstract
This paper describes the design and performance of an automated system for inspection of multilayered plastic bags recently developed at Industrial Research Limited. The system is capable of detecting and classifying sub-millimeter defects and applying grading criteria at production rates. This system will shortly be developed further for installation in a packaging manufacturing line. Unlike other plastic web inspection systems, this system was required to discriminate between two quite distinct, and optically dissimilar, types of defect. This necessitated, in particular, careful lighting design. Furthermore, the grading process is required to accommodate seams, serial numbers and other artefacts introduced by the bag manufacturing process.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chris C. Bowman, Olof J. Olsson, G. Terry Palmer, David W. Penman, "On-line high-resolution inspection of multilayered plastic bags", Proc. SPIE 2347, Machine Vision Applications, Architectures, and Systems Integration III, (3 October 1994); doi: 10.1117/12.188758; https://doi.org/10.1117/12.188758
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