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6 January 1994 Distortion characteristics and mapping in triangulation imaging systems
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Proceedings Volume 2348, Imaging and Illumination for Metrology and Inspection; (1994)
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Tools are now available for measurement imaging system designers to model optical distortion thoroughly and reduce it through design choices. In the case of modern automated systems, however, it is frequently more feasible to calibrate out the non-linearities and perform a real- time error correction operation. This paper presents, for the case of triangulation line scan or line-of-light imagers, some design trade-offs affecting distortion and general measurement linearity and analyzes the form of post-image correction method required. The 2D, cubic nature of a general distortion characteristic might typically mandate using a 2D correction value matrix, but one can exploit the inherent 1D nature of line-scan triangulation imaging in many cases to reduce the correction array to a 1D vector. Graphics of distortion simulations and empirical mappings are presented, and applicability of the analysis to several triangulation implementations is discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald B.T. Kilgus and Donald J. Svetkoff "Distortion characteristics and mapping in triangulation imaging systems", Proc. SPIE 2348, Imaging and Illumination for Metrology and Inspection, (6 January 1994);

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