6 January 1994 Line model for multisignature Gibbs classification
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Proceedings Volume 2348, Imaging and Illumination for Metrology and Inspection; (1994) https://doi.org/10.1117/12.198857
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Abstract
The performance of the Gibbs Classifier over a statistically heterogeneous image can be improved if the locally stationary regions in the image are disassociated from each other through the mechanism of the interaction parameters defined at the local neighborhood level. This usually involves the construction of a line process for the image. In this paper we describe a method for constructing a line process for multisignature images based on the differential (total derivative) of the image which, when expressed statistically, can provide an a priori estimate of the line field.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ian R. Greenshields, Ian R. Greenshields, Junchul Chun, Junchul Chun, } "Line model for multisignature Gibbs classification", Proc. SPIE 2348, Imaging and Illumination for Metrology and Inspection, (6 January 1994); doi: 10.1117/12.198857; https://doi.org/10.1117/12.198857
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