Reconstruction of surface topography using Fourier phase of structured light

Bradley G. Boone; Lane De Nicola; Barry E. Grabow

doi:10.1117/12.198843

6 January 1994 Reconstruction of surface topography using Fourier phase of structured light

Bradley G. Boone, Lane De Nicola, Barry E. Grabow

Proceedings Volume 2348, Imaging and Illumination for Metrology and Inspection; (1994) https://doi.org/10.1117/12.198843
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States

Abstract

A variety of techniques have been previously developed for surface topography reconstruction using CCD video images and various image processing algorithms. These include passive stereo disparity estimation using sub-area image correlation, confocal imaging (depth from focus), as well as structured light techniques. These approaches are compared on the basis of theoretical height error and algorithm complexity. A simple post-processing scheme based on the use of Fourier phase of structured light is then described, and results are shown from height measurements of tens of microns over areas on the order of a centimeter. A diode laser source is used in conjunction with a fan-beam refractive element, appropriate optical filtering, microscope, and CCD camera. This approach has application to long working-distance microscopy, closed-loop numerical control of machining, and retinal surface topography for early disease detection. Our approach offers a simple, low-cost, and real-time method of surface topography visualization and closed-loop machine tool control. Reflected laser beam quality and associated digital image filtering are considered with respect to the nature of possible surface materials measured.

Citation Download Citation

Bradley G. Boone, Lane De Nicola, and Barry E. Grabow "Reconstruction of surface topography using Fourier phase of structured light", Proc. SPIE 2348, Imaging and Illumination for Metrology and Inspection, (6 January 1994); https://doi.org/10.1117/12.198843

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