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4 January 1995 Phase measurement using a liquid crystal point diffraction interferometer
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Proceedings Volume 2349, Industrial Optical Sensors for Metrology and Inspection; (1995) https://doi.org/10.1117/12.198695
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Abstract
A point diffraction interferometer with a liquid crystal filter is used to measure a phase object. A reference beam is locally generated by a microsphere embedded within the liquid crystal layer. Phase shifts between the object and reference beams are introduced by varying a voltage across the birefringent nematic liquid crystal layer. Periodic phase measurement errors caused by modulations in the average intensity distributions are discussed, and a normalization method is described to reduce the errors. Experimental results are compared to a computer simulation to verify that the periodic errors are caused by intensity variations in the object beam.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Carolyn R. Mercer and Katherine Creath "Phase measurement using a liquid crystal point diffraction interferometer", Proc. SPIE 2349, Industrial Optical Sensors for Metrology and Inspection, (4 January 1995); https://doi.org/10.1117/12.198695
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