13 October 1994 Contour analysis algorithms for high-speed inspection
Author Affiliations +
Abstract
The visual inspection of many industrial products is based on contour analysis. The main task is the detection of defects like cracks and chips. The automation of this visual inspection procedure requires robust and flexible systems and algorithms. This paper describes new contour analysis algorithms for defect detection. Innovative techniques for contour filtering and analysis (e.g., scale-space analysis) are presented. The performance of different approaches is shown by several industrial examples and applications.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Knut Kille, Knut Kille, } "Contour analysis algorithms for high-speed inspection", Proc. SPIE 2354, Intelligent Robots and Computer Vision XIII: 3D Vision, Product Inspection, and Active Vision, (13 October 1994); doi: 10.1117/12.189086; https://doi.org/10.1117/12.189086
PROCEEDINGS
10 PAGES


SHARE
RELATED CONTENT


Back to Top