6 October 1994 Data merging for high-resolution surface profiling
Author Affiliations +
Proceedings Volume 2355, Sensor Fusion VII; (1994) https://doi.org/10.1117/12.189067
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Abstract
Three dimensional surface measurements are required in a number of industrial processes. These measurements have commonly been made using contact probes, but optical sensors are now available that allow fast, non-contact measurements. A common characteristic of optical surface profilers is the trade-off between measurement accuracy and field of view. In order to measure large objects with high resolution, multiple views are required. An accurate transformation between the different views is needed to reconstruct the entire surface. We demonstrate a method of obtaining the transformation by choosing a small number of control points that lie in the overlapping region between two views. The selection of the control points is independent of the object geometry, and only an approximate knowledge of the overlapping region is required.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ajit Venkataraman, Harold J. Schock, Carolyn R. Mercer, "Data merging for high-resolution surface profiling", Proc. SPIE 2355, Sensor Fusion VII, (6 October 1994); doi: 10.1117/12.189067; https://doi.org/10.1117/12.189067
PROCEEDINGS
10 PAGES


SHARE
Back to Top