Anomaly of the electrical properties for CoMnNiO nanocrystalline thin film

Hui Tan; Mingde Tao; Shigeng Song

doi:10.1117/12.190729

26 October 1994 Anomaly of the electrical properties for CoMnNiO nanocrystalline thin film

Hui Tan, Mingde Tao, Shigeng Song

Proceedings Volume 2364, Second International Conference on Thin Film Physics and Applications; (1994) https://doi.org/10.1117/12.190729
Event: Thin Film Physics and Applications: Second International Conference, 1994, Shanghai, China

Abstract

When annealed at various temperature the amorphous film of CoMnNiO deposited by R.F. Sputtering transforms into nano-crystalline and polycrystalline, and grain size increases with increasing annealing temperature and time. The study indicated that the resistivity of the nano-crystalline films is lot bigger than of the amorphous and ploycrystalline films, and the relations of material constant (B) to temperature (T) for the nano-films were peculiar. It was suspected that anomaly of the electrical properties relate to higher density of the grain boundary in the nano-film.

Citation Download Citation

Hui Tan, Mingde Tao, and Shigeng Song "Anomaly of the electrical properties for CoMnNiO nanocrystalline thin film", Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); https://doi.org/10.1117/12.190729

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available