26 October 1994 Application of frustrated total reflection
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Proceedings Volume 2364, Second International Conference on Thin Film Physics and Applications; (1994) https://doi.org/10.1117/12.190746
Event: Thin Film Physics and Applications: Second International Conference, 1994, Shanghai, China
Abstract
By the use of total reflection of a laser beam to generate fluorescence in a second medium, surface contours of, e.g., cells may be determined with an accuracy of about 1-2 nm.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oliver S. Heavens, "Application of frustrated total reflection", Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190746; https://doi.org/10.1117/12.190746
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