26 October 1994 Application of frustrated total reflection
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Proceedings Volume 2364, Second International Conference on Thin Film Physics and Applications; (1994) https://doi.org/10.1117/12.190746
Event: Thin Film Physics and Applications: Second International Conference, 1994, Shanghai, China
Abstract
By the use of total reflection of a laser beam to generate fluorescence in a second medium, surface contours of, e.g., cells may be determined with an accuracy of about 1-2 nm.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oliver S. Heavens, Oliver S. Heavens, } "Application of frustrated total reflection", Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190746; https://doi.org/10.1117/12.190746
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