Microstructure of the source material for PbTe film deposition

Su-ying Zhang; Ge-ya Wang; Tian-Shen Shi

doi:10.1117/12.190732

26 October 1994 Microstructure of the source material for PbTe film deposition

Su-ying Zhang, Ge-ya Wang, Tian-Shen Shi

Proceedings Volume 2364, Second International Conference on Thin Film Physics and Applications; (1994) https://doi.org/10.1117/12.190732
Event: Thin Film Physics and Applications: Second International Conference, 1994, Shanghai, China

Abstract

The microstructure of source material for depositing PbTe high refractive film has been investigated by transmission electron microscopy. The results indicate that the PbTe source material is in good monocrystalline form and the excess Te presents in the form of plate of 5-150 nm on {100} planes. Its density is about 10¹⁵ - 10¹⁶/cm³ and homogeneously distributed in the matrix.

Citation Download Citation

Su-ying Zhang, Ge-ya Wang, and Tian-Shen Shi "Microstructure of the source material for PbTe film deposition", Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); https://doi.org/10.1117/12.190732

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