26 October 1994 Microstructure of the source material for PbTe film deposition
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Proceedings Volume 2364, Second International Conference on Thin Film Physics and Applications; (1994) https://doi.org/10.1117/12.190732
Event: Thin Film Physics and Applications: Second International Conference, 1994, Shanghai, China
Abstract
The microstructure of source material for depositing PbTe high refractive film has been investigated by transmission electron microscopy. The results indicate that the PbTe source material is in good monocrystalline form and the excess Te presents in the form of plate of 5-150 nm on {100} planes. Its density is about 1015 - 1016/cm3 and homogeneously distributed in the matrix.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Su-ying Zhang, Ge-ya Wang, Tian-Shen Shi, "Microstructure of the source material for PbTe film deposition", Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190732; https://doi.org/10.1117/12.190732
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