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26 October 1994 PbTi03 film processing and characterization
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Proceedings Volume 2364, Second International Conference on Thin Film Physics and Applications; (1994) https://doi.org/10.1117/12.190748
Event: Thin Film Physics and Applications: Second International Conference, 1994, Shanghai, China
Abstract
Thickfilm technology has been used to prepare PbTiO3 films. DC electrical conduction mechanism has been studied with the films and a diplacive second order phase transition is reported here. Compositional analysis and surface morphology of the films have been done by X-rays and S.E.M. Room temperature refractive index and permittivity studies in the millimeter wave lengths have been reported.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tapan Kumar Gupta and Kulapat Permbhusiri "PbTi03 film processing and characterization", Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); https://doi.org/10.1117/12.190748
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