You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
26 October 1994PbTi03 film processing and characterization
Thickfilm technology has been used to prepare PbTiO3 films. DC electrical conduction mechanism has been studied with the films and a diplacive second order phase transition is reported here. Compositional analysis and surface morphology of the films have been done by X-rays and S.E.M. Room temperature refractive index and permittivity studies in the millimeter wave lengths have been reported.
The alert did not successfully save. Please try again later.
Tapan Kumar Gupta, Kulapat Permbhusiri, "PbTi03 film processing and characterization," Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); https://doi.org/10.1117/12.190748