Paper
3 March 1995 Dual-use applications for e-beam-pumped semiconductor lasers
Robert R. Rice, James F. Shanley, Neil F. Ruggieri
Author Affiliations +
Abstract
The collapse of the Soviet Union opened many areas of laser technology to the West. E-beam-pumped semiconductor lasers were pursued for 25 years in several Soviet institutes. Thin single crystal screens of II-VI alloys (ZnCdxSe1-x, CdSxSe1-x) were incorporated in laser CRTs to produce scanned visible laser beams at average powers greater than 10 W. Resolutions of 2500 lines were demonstrated by the Russians. MDA-W is performing a contract for ARPA to assess e-beam- pumped semiconductor laser technology for high brightness, high resolution RGB laser projection application. Transfer of II-VI crystal growth and screen processing technology is underway, and initial results will be reported. Various techniques (cathodoluminescence, one- and two- photon laser pumping, etc.) were used to assess material quality and screen processing damage. High voltage (75 kV) video electronics were designed and procured in the U.S. to operate test laser tubes obtained from Russian sources. The primary military applications of interest to MDA are flight simulator visuals, command center large screen projection and possibly cockpit display. Laser radar, designation, and communication are secondary applications. Some of the commercial applications included electronic cinema, teleconference display, university auditorium display, laser microscopy, and optical computing. Applications and plans for commercialization will be discussed.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert R. Rice, James F. Shanley, and Neil F. Ruggieri "Dual-use applications for e-beam-pumped semiconductor lasers", Proc. SPIE 2374, Novel Applications of Lasers and Pulsed Power, (3 March 1995); https://doi.org/10.1117/12.205012
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KEYWORDS
Semiconductor lasers

Projection systems

Crystals

Laser applications

Electronics

Prototyping

Reliability

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