30 March 1995 Evanescent photon capture by atomic force microscope (AFM) tips
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Abstract
Photon tunneling in the near field of a surface illuminates under Kretschmann's conditions has long been recognized. This has led to a specific scanning probe technique referred to as Photon Scanning Tunneling Microscopy (PSTM). More recently it was shown that AFM tips can be used as convenient optical converters owing to their transparency in the visible of near infrared domain. However the capture mechanism involved in very small silicon tips shows a strong scattering contribution leading to long range resonances. In the present work a series of experiments is presented which rely on infrared (1.06 micrometers ) evanescent wave capture by a Si tip at the surface of a semi-insulating InP prism. From our experimental results it is deduced that the conversion is mainly controlled by the classical dielectric model even though if a strong scattering is induced at the tip end. It is shown that the transmitted light is restricted to a limited solid angle which roughly corresponds to the tip cone angle. An important emission of scattered light is also observed from the outside which follows an exponential proximity dependence. The angular variation of the collected intensity is also studied as a function of the incidence angle; this observation could indicate that an important depth of the tip is involved in the collection mechanism.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michel Castagne, Christel Prioleau, Jean-Pierre Fillard, and E. Baudry "Evanescent photon capture by atomic force microscope (AFM) tips", Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); doi: 10.1117/12.205928; https://doi.org/10.1117/12.205928
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