30 March 1995 Fluorescence scanning near-field optical microscopy (FSNOM) by measuring the decay time of a fluorescent particle
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Abstract
We propose a Fluorescent Scanning Near-Field Optical Microscope (FSNOM) based upon the measurement of the decay time of a fluorescent particle adsorbed on a SNOM tip. The purpose of the experiment is to measure the decay time variations of the fluorescent particle when the tip is scanned at a few nanometers from the surface of a sample. We describe the experimental set-up and present a theoretical model: it calculates, by a perturbation method, the variations of the life-time on a rough surface. The formalism is rapidly described and first theoretical life- time signals are presented.
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Dominique Barchiesi, Thierry Pagnot, Christian Pieralli, Daniel Van Labeke, "Fluorescence scanning near-field optical microscopy (FSNOM) by measuring the decay time of a fluorescent particle", Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); doi: 10.1117/12.205916; https://doi.org/10.1117/12.205916
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