30 March 1995 Method to measure the actual vibrational amplitude of the tip in shear force microscope
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Proceedings Volume 2384, Scanning Probe Microscopies III; (1995); doi: 10.1117/12.205932
Event: Photonics West '95, 1995, San Jose, CA, United States
Abstract
We present a method to measure the actual amplitude of the tip vibration in shear force microscope and near-field scanning optical microscope (NSOM). The method is based on the measurement of the laser light focused on and scattered by the tip. Different from the method already used in NSOM, the equilibrium point of the tip vibration is set to move and both dc and ac part of the scattering light is measured. The dc and ac data can be analyzed to give the actual vibrational amplitude.
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Chih-Chun Wei, Yuan-Chuan Lien, Wunshain S. Fann, "Method to measure the actual vibrational amplitude of the tip in shear force microscope", Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); doi: 10.1117/12.205932; https://doi.org/10.1117/12.205932
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KEYWORDS
Light scattering

Near field scanning optical microscopy

Scattering

Microscopes

Laser scattering

Optical microscopes

Photodetectors

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