30 March 1995 Near-field microscopy of thin films: application to polymeric structures
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Near field scanning optical microscopy of thin birefringent samples is described. The system utilized is the linear polarizing near field microscope, resulting in a pure birefringence image of the sample. The sign of the birefringence is also preserved. Two specific classes of sample are studied. These include thin sections of Kevlar fibers, and polymer dispersed liquid crystals. Results are correlated with simultaneously obtained topographic images. Based on experimental observations, the relative strength of the optical indices of the structures is determined
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Mehdi Vaez-Iravani, Mehdi Vaez-Iravani, Ricardo Toledo-Crow, Ricardo Toledo-Crow, Harald Ade, Harald Ade, R. Spontak, R. Spontak, "Near-field microscopy of thin films: application to polymeric structures", Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); doi: 10.1117/12.205926; https://doi.org/10.1117/12.205926

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