7 April 1995 Analysis of surfaces, films, and multilayers by resonant laser ablation
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In this manuscript we review briefly the history of Resonant Laser Ablation (RLA), and discuss some current ideas regarding sample preparation, laser parameters, and mechanisms. We also discuss current applications including spectral analysis of trace components, depth profiling of thin films and multilayer structures, and the use of RLA with the Ion Trap Mass Spectrometer (ITMS).
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. M. Allen, T. M. Allen, C. H. Smith, C. H. Smith, Peter B. Kelly, Peter B. Kelly, John E. Anderson, John E. Anderson, Gregory C. Eiden, Gregory C. Eiden, A. W. Garrett, A. W. Garrett, C. G. Gill, C. G. Gill, P. H. Hemberger, P. H. Hemberger, Nicholas S. Nogar, Nicholas S. Nogar, } "Analysis of surfaces, films, and multilayers by resonant laser ablation", Proc. SPIE 2385, Advanced Optical Methods for Ultrasensitive Detection, (7 April 1995); doi: 10.1117/12.206451; https://doi.org/10.1117/12.206451

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