8 May 1995 Identification of lifetime characteristics in fluorescence experiments
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Our work is devoted to the analysis if exponential fluorescence decays, convoluted with instrumental function of a device. We suggest methods of deconvolution and estimation of exponential parameters, based on the transformation of the convolution integral to linear differential equation with constant coefficients. Integrating this equation and applying least squares method (for smoothing experimental data), one can obtain the set of linear equations for parameters. These methods can be adopted for analysis of anisotropy curves, global analysis of the curves, registered at the number of wavelengths, temperatures or concentration of solution, reconstruction of true decay via the intensity curve of reference compound radiation. Simulation model of the process of optical radiation registration was designed. It consists in the numeric generation of the measured intensities and additionally two sources of distortion: random (Poisson and Gaussian) noise and nonrandom (background, shifts). The accuracy of estimation is determined by z2 criterion and residuals autocorrelation function. The standard deviation for parameters can be calculated by bootstrap method or analytically. The investigation of the deconvolution methods let us work out some recommendations for the optimal usage of the obtained methods in the processing of experimental data.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir V. Apanasovich, Vladimir V. Apanasovich, Eugene G. Novikov, Eugene G. Novikov, } "Identification of lifetime characteristics in fluorescence experiments", Proc. SPIE 2388, Advances in Fluorescence Sensing Technology II, (8 May 1995); doi: 10.1117/12.208496; https://doi.org/10.1117/12.208496


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