5 April 1995 Modeling signal delay distribution in optoelectronic architectures
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Abstract
Important properties of layouts are interconnection length, signal delay distribution, area (or space) requirements, power dissipation, bandwidth, reliability, etc. The usefulness of optoelectronic interconnections should be manifest in at least some of these properties. This paper is concerned with quantitatively modeling future optoelectronic systems, and estimating signal delay distribution. In this respect, it is an extension of previous work only considering average wire length. It leads to a characterization of how to use optoelectronic interconnections and how much is expected to be gained from it. As a direct result, we draw some preliminary conclusions on how to use optical interconnections in optoelectronic architectures.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Herwig G. Van Marck, Jan M. Van Campenhout, "Modeling signal delay distribution in optoelectronic architectures", Proc. SPIE 2400, Optoelectronic Interconnects III, (5 April 1995); doi: 10.1117/12.206318; https://doi.org/10.1117/12.206318
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