Optical FET receivers for neural network applications

Jiafu Luo; Annette Grot; Demetri Psaltis

doi:10.1117/12.206325

5 April 1995 Optical FET receivers for neural network applications

Jiafu Luo; Annette Grot; Demetri Psaltis

Author Affiliations +

Proceedings Volume 2400, Optoelectronic Interconnects III; (1995) https://doi.org/10.1117/12.206325
Event: Photonics West '95, 1995, San Jose, CA, United States

Abstract

Optical FET detectors were fabricated in both the MOSIS/Vitesse HGaAs₃ process and the AT&T field-effect-transistor-self-electro-optic effect device (FET-SEED) process. Typical responsivity is in the order of 1,000 A/W and response time in the order of 10 to 100 microsecond(s) ec at 50 nW optical input power. Such high gain detectors through commercially available industrial foundries are especially useful for optical neural network applications where high density integration requires very good uniformity and power dissipation limits the available optical power. The mechanism of such optical FET detectors are discussed.

Citation Download Citation

Jiafu Luo, Jiafu Luo, Annette Grot, Annette Grot, Demetri Psaltis, Demetri Psaltis, } "Optical FET receivers for neural network applications", Proc. SPIE 2400, Optoelectronic Interconnects III, (5 April 1995); doi: 10.1117/12.206325; https://doi.org/10.1117/12.206325

ACCESS THE FULL ARTICLE

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $14.40

Non-members: $18.00 ADD TO CART

Show All Keywords

Keywords/Phrases

Search In:

Publication Years