Determination of the mean refractive index and thickness of dichromated gelatin holographic films using the thin film resonance method

Hans Dieter Tholl; M. Doehmen; Christo G. Stojanoff

doi:10.1117/12.205351

23 March 1995 Determination of the mean refractive index and thickness of dichromated gelatin holographic films using the thin film resonance method

Hans Dieter Tholl, M. Doehmen, Christo G. Stojanoff

Author Affiliations +

Proceedings Volume 2405, Holographic Materials; (1995) https://doi.org/10.1117/12.205351
Event: Photonics West '95, 1995, San Jose, CA, United States

Abstract

The precise knowledge of the mean refractive index and the thickness of holographic films is important in applications such as polarization-sensitive holographic optical elements or substrate-mode holography. We present results of the measurements of the mean refractive index and the thickness of dichromated gelatin films before exposure, uniformly exposed films, and holograms. The measurements are based on the thin film resonance method. The interference between the two waves reflected at the air-film surface and the film-substrate interface modulates the reflectivity of the holographic film as a function of the angle of incidence. The frequency and the amplitude of this modulation are analyzed in order to determine the optical parameters. With the measured mean refractive index and the thickness as input we simulated the angular response of volume gratings and compared the results of the modelling with experimental data. The excellent agreement between the simulated and measured diffraction efficiencies confirm the applicability of the method to holographic films.

Citation Download Citation

Hans Dieter Tholl, M. Doehmen, and Christo G. Stojanoff "Determination of the mean refractive index and thickness of dichromated gelatin holographic films using the thin film resonance method", Proc. SPIE 2405, Holographic Materials, (23 March 1995); https://doi.org/10.1117/12.205351

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