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23 March 1995 Method for characterization of film thickness and refractive index in volume holographic materials
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Abstract
Independent characterization of changes in film thickness and refractive index is necessary for accurate prediction of the Bragg playback conditions of volume holograms after processing. We have developed a method which uses weak holographic mirrors to characterize processing- induced swelling or shrinkage and index change in volume holographic films, and have applied this method to DuPont OmniDexTM holographic recording films. Results of these measurements are presented.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sylvia H. Stevenson and Kirk W. Steijn "Method for characterization of film thickness and refractive index in volume holographic materials", Proc. SPIE 2405, Holographic Materials, (23 March 1995); https://doi.org/10.1117/12.205352
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