23 March 1995 Light scattering in 4Pi confocal microscopy
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Abstract
We measure the form of the point spread function in the three main configurations of 4 Pi microscopy as well as the traditional confocal arrangement. We confirm, for the first time experimentally, the equivalence between the 4 Pi (A) and 4 Pi (B) geometries. We measure a 6.9 fold increase in axial resolution over the confocal case.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Martin Schrader, Stefan W. Hell, Tony Wilson, "Light scattering in 4Pi confocal microscopy", Proc. SPIE 2412, Three-Dimensional Microscopy: Image Acquisition and Processing II, (23 March 1995); doi: 10.1117/12.205326; https://doi.org/10.1117/12.205326
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