10 April 1995 Measurement of kinds of thresholds during the interaction between the laser beam and the CCD
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Abstract
The interaction process of laser and charge-coupled devices (CCD) having MOS structure has been analyzed in brief, and several kinds of damage thresholds have been put forward. On the basis of experimental test, the heat melting threshold, optical breakdown threshold, and direct damage threshold produced by a Q-switched Nd:YAG laser acted the CCD and laser energy threshold causing the whole device to fail have been obtained first.
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Xiao-Wu Ni, Jian Lu, Zhen-Hua Lin, Anzhi He, "Measurement of kinds of thresholds during the interaction between the laser beam and the CCD", Proc. SPIE 2415, Charge-Coupled Devices and Solid State Optical Sensors V, (10 April 1995); doi: 10.1117/12.206520; https://doi.org/10.1117/12.206520
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