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30 March 1995 Selection of image features for distribution-map classifiers
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Proceedings Volume 2422, Document Recognition II; (1995)
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1995, San Jose, CA, United States
A useful metric for pattern classification can be derived from a series of one-dimensional maps of empirical class-conditional distributions. To achieve maximum classification accuracy, the distributions need to be projected into subspaces where they are locally dense and the classes are at least partially separable. We describe a method where useful projections are obtained automatically by a sequence of cluster and linear discriminant analyses. Each projection can be considered as a feature that contributes to the elimination of unresolved ambiguities. We discuss conditions under which the method can achieve maximum accuracy. In an experiment of applying the method to machine-printed character images, we show that the method yields a classifier that has very low error rate, and can be improved with additional training data.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tin Kam Ho "Selection of image features for distribution-map classifiers", Proc. SPIE 2422, Document Recognition II, (30 March 1995);

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