High-sensitivity-time-integrated measurement devices

A. Shlifer; Michael Mesh; Moshe Tur

doi:10.1117/12.211226

6 June 1995 High-sensitivity-time-integrated measurement devices

A. Shlifer, Michael Mesh, Moshe Tur

Proceedings Volume 2426, 9th Meeting on Optical Engineering in Israel; (1995) https://doi.org/10.1117/12.211226
Event: Optical Engineering in Israel: 9th Meeting, 1994, Tel-Aviv, Israel

Abstract

High sensitivity, ring-type measurement devices based on acousto-optic and fiber-optic delay lines are described. Applications of these devices for linear and angular displacements with resolution of 0.1 micrometers and 1 (mu) rad are shown. Methods of further improvement of the devices' characteristics are discussed.

Citation Download Citation

A. Shlifer, Michael Mesh, and Moshe Tur "High-sensitivity-time-integrated measurement devices", Proc. SPIE 2426, 9th Meeting on Optical Engineering in Israel, (6 June 1995); https://doi.org/10.1117/12.211226

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