14 July 1995 Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses II: theory
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Abstract
Our extensive measurements of damage thresholds for fused silica and several fluorides (LiF, CaF, MgF, and BaF) at 1053 and 526 nm for pulse durations, (tau) , ranging from 275 fs to 1 ns are reported elsewhere at this meeting. A theoretical model based on electron production via multiphoton ionization, Joule heating, and collisional (avalanche) ionization is in good agreement with experimental results.
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Michael D. Feit, Alexander M. Rubenchik, Bruce W. Shore, Brent C. Stuart, Michael D. Perry, "Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses II: theory", Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, (14 July 1995); doi: 10.1117/12.213727; https://doi.org/10.1117/12.213727
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