14 July 1995 Materials characterization, optical spectroscopy, and laser damage studies of electrochromically and photochromically damaged KTiOPO4 (KTP)
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Abstract
The techniques utilized to study the surface and bulk properties of KTiOPO4 (KTP) were Rutherford backscattering (RBS), particle induced x-ray emission (PIXE), secondary ion mass spectrometry (SIMS), optical absorption and emission spectroscopy, and controlled laser damage. RBS and SIMS results provide strong evidence for potassium ion and titanium ion migration from the bulk to the electrode surface under an applied DC voltage. Optical measurements suggest the presence of Ti3+ ions in pristine, EC and PC damages KTP. Catastrophic damage was induced models will be presented to rationalize the RBS, PIXE and SIMS data for the impurities, and a damage mechanism consistent with the findings of the laser damage and optical absorption and emission experiments will be discussed.
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John R. Quagliano, Roger R. Petrin, T. C. Trujillo, R. Wenzel, L. John Jolin, M. T. Paffett, C. J. Maggiore, Nigel J. Cockroft, John C. Jacco, "Materials characterization, optical spectroscopy, and laser damage studies of electrochromically and photochromically damaged KTiOPO4 (KTP)", Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, (14 July 1995); doi: 10.1117/12.213710; https://doi.org/10.1117/12.213710
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