Speckle Metrology For The Study Of Small Particles And Droplets

C. M. Vest

doi:10.1117/12.959296

3 December 1980 Speckle Metrology For The Study Of Small Particles And Droplets

C. M. Vest

Proceedings Volume 0243, Applications of Speckle Phenomena; (1980) https://doi.org/10.1117/12.959296
Event: 24th Annual Technical Symposium, 1980, San Diego, United States

Abstract

The speckle pattern formed when laser light is scattered by a large number of small spherical particles or droplets is investigated. Double-exposure speckle photography is used to measure the decrease of correlation which occurs when the angle of incidence of light on the scattering particles is changed by an amount a. Empirical equations relating to this loss of correlation to dimensionless groups involving the concentration, mean diameter and depth of the collection of scattering particles are given, and an analytical model which describes the basic phenomenon is presented.

Citation Download Citation

C. M. Vest "Speckle Metrology For The Study Of Small Particles And Droplets", Proc. SPIE 0243, Applications of Speckle Phenomena, (3 December 1980); https://doi.org/10.1117/12.959296

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