Paper
9 June 1995 Effect of PAC structure and resist morphology on the control of surface inhibition in positive photoresist systems
Bernard T. Beauchemin Jr., Rodney J. Hurditch, Medhat A. Toukhy, Andrew J. Blakeney
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Abstract
The influence of PAC structure and morphology on the surface induction in novolak based resist systems was investigated. Variation in surface induction for a given PAC is caused by changes in the morphology between the surface and the bulk of the resist film resulting from solvent depletion and is characteristic of the novolak. PAC structure, particularly its functionality [i.e., maximum amount of diazonaphthoqunione (DNQ) esterifiable OH], was found to greatly influence the amount of surface inhibition.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernard T. Beauchemin Jr., Rodney J. Hurditch, Medhat A. Toukhy, and Andrew J. Blakeney "Effect of PAC structure and resist morphology on the control of surface inhibition in positive photoresist systems", Proc. SPIE 2438, Advances in Resist Technology and Processing XII, (9 June 1995); https://doi.org/10.1117/12.210349
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KEYWORDS
Picture Archiving and Communication System

Polymers

Diffusion

Skin

Molecules

Photoresist materials

Control systems

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