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23 January 1995 Absolute measurements of the reflection coefficients of multilayer x-ray mirrors in the ultrasoft x-ray region
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Proceedings Volume 2453, X-Ray Optics and Surface Science; (1995) https://doi.org/10.1117/12.200281
Event: X-ray Optics and Surface Science, 1994, none, Russian Federation
Abstract
The angular dependencies of the reflection coefficients of ultrasoft X- ray radiation by X-ray interference mirrors were investigated for samples prepared by two methods: magnetron spattering and electron beam evaporation. The theoretical evaluations of these reflection coefficients were compared with the obtained experimental results. The investigated multilayer X-ray mirrors were found to have extremely high quality.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. I. Lyakhovskaya "Absolute measurements of the reflection coefficients of multilayer x-ray mirrors in the ultrasoft x-ray region", Proc. SPIE 2453, X-Ray Optics and Surface Science, (23 January 1995); https://doi.org/10.1117/12.200281
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