The computer program has an analysis section permitting the modeling of the filters in transmission and reflection. It also studies the sensibility of theirs coefficients to casual filter constructing errors. The second section of the program permits the drawing of a tridimensional graphic modeling the evolution of the reflectance and transmittance during the deposition of the layers. This graphic outlines the most adequate wavelengths for the thickness control during deposition.
"Program of interferential-filter analysis and preparation control", Proc. SPIE 2461, ROMOPTO '94: Fourth Conference in Optics, (8 March 1995); doi: 10.1117/12.203484; https://doi.org/10.1117/12.203484