2 June 1995 Analysis of errors associated with measurement of projector nonuniformity
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Abstract
This paper addresses the process of measuring the output of individual elements of a pixelized scene projector. The in-band scene projector is a key component of a sensor/seeker test facility such as the Kinetic Kill Vehicle Hardware-in-the-Loop Simulator (KHILS) at Eglin AFB, Florida. Analyses are presented which quantify errors associated with measuring the radiant intensity of individual pixels on a scene projector. The errors are broken down into sampling errors, truncation errors, and random measurement noise. The magnitude of each error source is determined as a function of parameters of the projector and sensor such as the element spacings, and blur. Guidelines for using this information to accurately and efficiently perform nonuniformity correction of a scene projector are presented.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Breck A. Sieglinger, David S. Flynn, Charles F. Coker, "Analysis of errors associated with measurement of projector nonuniformity", Proc. SPIE 2469, Targets and Backgrounds: Characterization and Representation, (2 June 1995); doi: 10.1117/12.210632; https://doi.org/10.1117/12.210632
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