2 June 1995 Optimization of measurement process variables used in radiance uniformity calibration of the emitter source for the wideband infrared scene projector (WISP)
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Abstract
generating a high degree of uniformity across the FOV in infrared scene simulators, over a wide dynamic range, is necessary to avoid introducing unintentional structure into the projected image. One challenge for calibration is establishing measurement of the radiance outputs of each of the 256,000 individuals pixels to the required accuracy levels at several radiance levels, within a reasonable time, with available instrumentation. Issues affecting measurement accuracy include the aperture, focal length, blur circle, and IFOV characteristics of the non-uniformity calibration (NUC) sensor, geometric and diffraction blur characteristics of the collimator optics (which vary with field position), NUC sensor noise and stability (temporal and spatial), emitter pixel geometry and temperature profile, and the relationship between the spectral characteristics of the NUC sensor and the source. Analyses are presented which determine the limitations on calibration accuracy based on predicted and measured performance of the WISP projector and the NUC sensor components. Some NUC sensor accuracy data, needed to support the determination of the overall process parameters, was collected in special NUC sensor tests and is presented herein. A combination of NUC process parameters is developed which achieves optimum accuracy in performing the NUC calibration, and which is expected to achieve the necessary calibrated uniformity performance of 1% for WISP.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles L. Malone, Charles L. Malone, David S. Flynn, David S. Flynn, } "Optimization of measurement process variables used in radiance uniformity calibration of the emitter source for the wideband infrared scene projector (WISP)", Proc. SPIE 2469, Targets and Backgrounds: Characterization and Representation, (2 June 1995); doi: 10.1117/12.210582; https://doi.org/10.1117/12.210582
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