22 May 1995 High field-of-view IR scanner using microlens arrays
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Abstract
There is a growing demand for a larger field coverage for scanning in IR instrumentation. We have explored the possibility of using the microlens arrays (MLAs) for this purpose, and have developed a generic IR imaging scanner. The application of MLAs in the wide-field IR imagers is presented, along with their advantages and limitations. A series of systems using MLAs and diffractive elements have been designed and analyzed for a diffraction-limited performance with 45 degree(s) and 60 degree(s) field of view for a f/1.4 IR imager operating in 3 - 5 micrometers wavelength range for 1-D and 2-D scanning applications. The optical design considerations, fabrication issues, and thermal effects are also discussed for these types of scanners.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chen Feng, Anees Ahmad, RamaGopal V. Sarepaka, "High field-of-view IR scanner using microlens arrays", Proc. SPIE 2470, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VI, (22 May 1995); doi: 10.1117/12.210053; https://doi.org/10.1117/12.210053
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