Performance characteristics, measurement procedures, and figures of merit for infrared focal plane arrays

Jan W. Baars; Max J. Schulz

doi:10.1117/12.210044

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22 May 1995 Performance characteristics, measurement procedures, and figures of merit for infrared focal plane arrays

Jan W. Baars, Max J. Schulz

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Proceedings Volume 2470, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VI; (1995) https://doi.org/10.1117/12.210044
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

Performance characteristics and test procedures for focal plane arrays (FPA) are defined. These definitions are generally compatible with those commonly used for single-detector elements. The performance characteristics include on-chip electronics for signal processing and readout. Time delay and integration (TDI) arrays are considered as well. Optical components other than focusing optics for spot and line illumination are excluded. The test procedure for TDI arrays includes the scanner. Figures of merit for individual detector elements of the FPA and for the FPA as a whole are derived, e.g., an effective array element detectivity, an array enhancement factor, a resolution figure of merit based on MTF measurements, and a uniformity figure of merit. A correction scheme for nonuniform response of the detector elements is presented together with a figure of merit for the correctability.

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Jan W. Baars and Max J. Schulz "Performance characteristics, measurement procedures, and figures of merit for infrared focal plane arrays", Proc. SPIE 2470, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VI, (22 May 1995); https://doi.org/10.1117/12.210044

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